Catalogue


X-ray photoelectron spectroscopy : an introduction to principles and practices /
Paul van der Heide.
imprint
Hoboken, N.J. : Wiley, 2012.
description
xvii, 241 p. : ill. ; 25 cm.
ISBN
1118062531 (hardback), 9781118062531 (hardback)
format(s)
Book
Holdings
More Details
imprint
Hoboken, N.J. : Wiley, 2012.
isbn
1118062531 (hardback)
9781118062531 (hardback)
contents note
Machine generated contents note: ForewardPrefaceAcknowledgementsTable of ContentsList of Relevant ConstantsChapter 1. Introduction to XPS/ESCAChapter 2. Atoms, Ions and their Electronic StructureChapter 3. XPS InstrumentationChapter 4. Data Collection and QuantificationChapter 5. Spectral Interpretation for SpeciationChapter 6. Some Case StudiesAppendicesTechnique Acronym ListsXPS Instrumental Based AbbreviationsGlossary of TermsQuestions and AnswersList of XPS VendorsReferencesIndexNotes.
abstract
"This book introduces readers interested in the field of X-ray Photoelectron Spectroscopy (XPS) to the practical concepts in this field. The book first introduces the reader to the language and concepts used in this field and then demonstrates how these concepts are applied. Including how the spectra are produced, factors that can influence the spectra (all initial and final state effects are discussed), how to derive speciation, volume analysed and how one controls this (includes depth profiling), and quantification along with background substraction and curve fitting methodologies. This is presented in a concise yet comprehensive manner and each section is prepared such that they can be read independently of each other, and all equations are presented using the most commonly used units. Greater emphasis has been placed on spectral understanding/interpretation. For completeness sake, a description of commonly used instrumentation is also presented. Finally, some complementary surface analytical techniques and associated concepts are reviewed for comparative purposes in stand-alone appendix sections"--
catalogue key
8316687
 
Includes bibliographical references (p. 233-236) and index.
A Look Inside
About the Author
Author Affiliation
Paul Van Der Heide, PHD, most recently served as the group leader of the Surface Analysis Department at Samsung Austin Semiconductor in Texas, which houses state-of-the-art XPS, AES, SIMS, and AFM instrumentation. Prior to this, he served in various professor-level positions within the Chemistry Department at the University of Houston.
Reviews
Review Quotes
"It is an excellent text and although a competent physicist might already have grasped the principles explained in this book, the multitude of XPS users I come across (PhD chemists, engineers and pharmacists) will find this a breath of fresh air." (Chemistry World, 1 September 2012)
SURFACE SCIENCE APPLIED SURFACE SCIENCE ADVANCED MATERIALS MATERIALS TODAY NATURE NANOTECHNOLOGY TRENDS IN ANALYTICAL CHEMISTRY ANALYTICAL & BIOANALYTICAL CHEMISTRY RAPID COMMUNICATIONS IN SPECTROSCOPY ANALYTICAL CHEMISTRY APPLIED SPECTROSCOPY MRS BULLETIN
"The book is a useful resource for those interested in the field, and will probably be found to be of particular value by instrumentation support professionals and nonspecialists." ( Analytical and Bioanalytical Chemistry , 14 February 2013) "It is an excellent text and although a competent physicist might already have grasped the principles explained in this book, the multitude of XPS users I come across (PhD chemists, engineers and pharmacists) will find this a breath of fresh air." (Chemistry World, 1 September 2012)
This item was reviewed in:
Reference & Research Book News, June 2012
To find out how to look for other reviews, please see our guides to finding book reviews in the Sciences or Social Sciences and Humanities.
Summaries
Main Description
This book introduces readers interested in the field of X-ray Photoelectron Spectroscopy (XPS) to the practical concepts in this field. The book first introduces the reader to the language and concepts used in this field and then demonstrates how these concepts are applied. Including how the spectra are produced, factors that can influence the spectra (all initial and final state effects are discussed), how to derive speciation, volume analysed and how one controls this (includes depth profiling), and quantification along with background substraction and curve fitting methodologies. This is presented in a concise yet comprehensive manner and each section is prepared such that they can be read independently of each other, and all equations are presented using the most commonly used units. Greater emphasis has been placed on spectral understanding/interpretation. For completeness sake, a description of commonly used instrumentation is also presented. Finally, some complementary surface analytical techniques and associated concepts are reviewed for comparative purposes in stand-alone appendix sections.
Main Description
The essential reference on X-ray Photoelectron Spectroscopy (XPS) and its practical applications
Bowker Data Service Summary
This text introduces readers interested in X-ray photoelectron spectroscopy to the practical concepts in this field. It introduces the reader to the language and concepts used in this field and then demonstrates how these concepts are applied.
Library of Congress Summary
"This book introduces readers interested in the field of X-ray Photoelectron Spectroscopy (XPS) to the practical concepts in this field. The book first introduces the reader to the language and concepts used in this field and then demonstrates how these concepts are applied. Including how the spectra are produced, factors that can influence the spectra (all initial and final state effects are discussed), how to derive speciation, volume analysed and how one controls this (includes depth profiling), and quantification along with background substraction and curve fitting methodologies. This is presented in a concise yet comprehensive manner and each section is prepared such that they can be read independently of each other, and all equations are presented using the most commonly used units. Greater emphasis has been placed on spectral understanding/interpretation. For completeness sake, a description of commonly used instrumentation is also presented. Finally, some complementary surface analytical techniques and associated concepts are reviewed for comparative purposes in stand-alone appendix sections"--"This book introduces readers interested in the field of X-ray Photoelectron Spectroscopy (XPS) to the practical concepts in this field. The book first introduces the reader to the language and concepts used in this field and then demonstrates how these concepts are applied"--
Back Cover Copy
The essential reference on X-ray Photoelectron Spectroscopy (XPS) and its practical applications X-ray Photoelectron Spectroscopy represents the most heavily used of the electron spectroscopies for surface analysis. This book serves as a definitive introduction to this field by providing concise yet comprehensive coverage of all key concepts and then supplying relevant, illuminating examples of real-world applications. Placing an emphasis on spectral understanding and interpretation, the book includes coverage of topics including: how to interpret the different spectra revealed by XPS; how they are produced and factors that can influence the spectra (including initial and final state effects); as well as how to derive speciation, volume analyzed and how to control this (including depth profiling), along with background substraction and curve-fitting methodologies. With each section standing alone, the text can be read from front to back or treated as a comprehensive resource that researchers, developers, and technicians of all levels can access as needed. Including review questions to help readers measure their comprehension of the material, as well as a comparative review of some complementary surface analytical techniques and associated concepts, X-ray Photoelectron Spectroscopy is designed to enhance understanding of this rapidly growing field.
Table of Contents
Forewordp. xi
Prefacep. xiii
Acknowledgmentsp. xv
List of Constantsp. xvii
Introductionp. 1
Surface Analysisp. 1
XPS/ESCA for Surface Analysisp. 5
Historical Perspectivep. 6
Physical Basis of XPSp. 7
Sensitivity and Specificity of XPSp. 10
Summaryp. 11
Atoms, Ions, And Their Electronic Structurep. 13
Atoms, Ions, and Matterp. 13
Atomic Structurep. 14
Electronic Structurep. 15
Quantum Numbersp. 16
Stationary-State Notationp. 18
Stationary-State Transition Notationp. 20
Stationary Statesp. 21
Spin Orbit Splittingp. 23
Summaryp. 25
Xps Instrumentationp. 27
Prerequisites of X-ray Photoelectron Spectroscopy (XPS)p. 27
Vacuump. 28
Vacuum Systemsp. 32
X-ray Sourcesp. 35
Standard Sourcesp. 37
Monochromated Sourcesp. 39
Gas Discharge Lampsp. 41
Synchrotron Sourcesp. 41
Electron Sourcesp. 42
Thermionic Sourcesp. 42
Ion Sourcesp. 43
EI Sourcesp. 43
Energy Analyzersp. 44
CMAp. 46
CHAp. 46
Modes of Operationp. 47
Energy Resolutionp. 48
Detectorsp. 49
EMsp. 50
Imagingp. 52
Serial Imagingp. 52
Parallel Imagingp. 54
Spatial Resolutionp. 56
Summaryp. 59
Data Collection and Quantificationp. 61
Analysis Proceduresp. 61
Sample Handlingp. 62
Data Collectionp. 64
Energy Referencingp. 65
Charge Compensationp. 69
X-ray and Electron-Induced Damagep. 71
Photoelectron Intensitiesp. 72
Photoelectron Cross Sectionsp. 74
The Analyzed Volumep. 75
Electron Path Lengthsp. 76
Takeoff Anglep. 79
The Background Signalp. 80
Quantificationp. 81
Information as a Function of Depthp. 83
Opening up the Third Dimensionp. 84
AR-XPS and Energy-Resolved XPSp. 84
Sputter Depth Profilingp. 87
Summaryp. 97
Spectral Interpretationp. 101
Speciationp. 101
Photoelectron Binding Energiesp. 102
The Z + 1 Approximationp. 106
Initial State Effectsp. 107
Final State Effectsp. 118
The Auger Parameterp. 133
Curve Fittingp. 135
Summaryp. 138
Some Case Studiesp. 141
Overviewp. 141
Iodine Impregnation of Single-Walled Carbon Nanotube (SWNT)p. 142
Analysis of Group IIA-IV Metal Oxidesp. 145
Analysis of Mixed Metal Oxides of Interest as SOFC Cathodesp. 151
Analysis of YBCO and Related Oxides/ Carbonatesp. 156
Summaryp. 163
Appendicesp. 167
Periodic Table of the Elementsp. 169
Binding Energies (B.E.Xps Or B.E.Xrf) of the Elementsp. 171
1s-3s, 2p-3p, and 3d Valuesp. 171
4s-5s, 4p-5p, and 4d Valuesp. 175
Some Quantum Mechanics Calculations of Interestp. 177
Some Statistical Distributions of Interestp. 181
Gaussian Distributionp. 182
Poisson Distributionp. 182
Lorentzian Distributionsp. 183
Some Optical Properties of Interestp. 185
Chromatic Aberrationsp. 186
Spherical Aberrationsp. 186
Diffraction Limitp. 186
Some Other Spectroscopic/Spectrometric Techniques of Interestp. 189
Photon Spectroscopiesp. 191
IR, RAIRS, ATR, and DRIFTSp. 191
Raman, SERS, and TERSp. 192
EDX and WDXp. 193
XRF and TXRFp. 194
Electron Spectroscopiesp. 195
UPSp. 195
AESp. 195
EELS, REELS, and HREELSp. 196
Ion Spectroscopies/Spectrometriesp. 196
SIMSp. 196
TAPp. 197
Ion Scattering Methodsp. 197
Some Microscopies of Interestp. 199
SEMp. 200
HIMp. 201
TEMp. 201
SPM (AFM and STM)-Based Techniquesp. 202
Some Reflection/Diffraction Techniques of Interestp. 205
XRDp. 206
GIDp. 206
XRRp. 207
LEEDp. 207
RHEEDp. 207
Technique Abbreviations Listp. 209
Instrument-Based Abbreviationsp. 213
Glossary of Termsp. 215
Questions and Answersp. 221
Xps Vendorsp. 229
Referencesp. 233
Indexp. 237
Table of Contents provided by Ingram. All Rights Reserved.

This information is provided by a service that aggregates data from review sources and other sources that are often consulted by libraries, and readers. The University does not edit this information and merely includes it as a convenience for users. It does not warrant that reviews are accurate. As with any review users should approach reviews critically and where deemed necessary should consult multiple review sources. Any concerns or questions about particular reviews should be directed to the reviewer and/or publisher.

  link to old catalogue

Report a problem