Catalogue


Handbook of charged particle optics /
edited by Jon Orloff.
edition
2nd ed.
imprint
Boca Raton, FL : CRC Press, c2009.
description
xi, 665 p. : ill.
ISBN
1420045547 (cloth), 9781420045543 (cloth)
format(s)
Book
Holdings
More Details
added author
imprint
Boca Raton, FL : CRC Press, c2009.
isbn
1420045547 (cloth)
9781420045543 (cloth)
catalogue key
6676981
 
Includes bibliographical references and index.
A Look Inside
Reviews
Review Quotes
… In giving [a] combination of practical and theoretical aspects, the book is a valuable reference when it comes to the design of charged particle optical elements in microscopy such as scanning electron microscopes or scanning transmission electron microscopes. … The index is very comprehensive and helps in making the book a valuable reference. Although the text comes from 18 different authors each with their individual style, it is nevertheless well written and clear throughout. The eight unnumbered colour pages at the centre of the book are also a nice feature. Altogether, the book is valuable for experts and those who want to become experts concerned with the design and understanding of charged particle optics as used in electron microscopy. Owing to the rigorous mathematical treatment of particle optical effects, it will also help in the analysis of observed effects such as aberrations and their correction, space charge effects, as well as issues concerning the resolution obtained in microscopy. -Manuel Vogel, Contemporary Physics, Vol. 51, Issue 4, July 2010
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Summaries
Main Description
With the growing proliferation of nanotechnologies, powerful imaging technologies are being developed to operate at the sub-nanometer scale. The newest edition of a bestseller, the Handbook of Charged Particle Optics, Second Edition provides essential background information for the design and operation of high resolution focused probe instruments. The book's unique approach covers both the theoretical and practical knowledge of high resolution probe forming instruments. The second edition features new chapters on aberration correction and applications of gas phase field ionization sources. With the inclusion of additional references to past and present work in the field, this second edition offers perfectly calibrated coverage of the field's cutting-edge technologies with added insight into how they work. Written by the leading research scientists, the second edition of the Handbook of Charged Particle Optics is a complete guide to understanding, designing, and using high resolution probe instrumentation.
Back Cover Copy
With the growing proliferation of nanotechnologies, powerful imaging technologies are being developed to operate at the sub-nanometer scale. A new edition of a bestseller, the Handbook of Charged Particle Optics, Second Edition provides essential background information for the design and operation of high resolution focused probe instruments.The book's unique approach covers both the theoretical and practical knowledge of high resolution probe forming instruments. The second edition features new chapters on aberration correction and applications of gas phase field ionization sources. With the inclusion of additional references to past and present work in the field, this second edition offers perfectly calibrated coverage of the field's cutting-edge technologies with added insight into how they work.Written by the leading research scientists, the second edition of the Handbook of Charged Particle Optics is a complete guide to understanding, designing, and using high resolution probe instrumentation.
Bowker Data Service Summary
Balancing its coverage of theory with a wide range of application areas, this handbook provides a complete guide to understanding, designing, and using high resolution instrumentation such as scanning electron microscopes, scanning transmission electron microscopes, and focused ion beam systems.
Main Description
Balancing its coverage of theory with a wide range of application areas, Handbook of Charged Particle Optics provides a complete guide to understanding, designing, and using high resolution instrumentation such as scanning electron microscope (SEM), scanning transmission electron microscope (STEM), and focused ion beam (FIB) systems. This second edition features new chapters on aberration correction, the transmission electron microscope (TEM), and applications of gas phase field ionization sources. Including additional references to past and present work in the field, this comprehensive text also presents up-to-date information of Schottky electron as well as liquid metal ion sources.
Table of Contents
Preface to the Second Editionp. vii
Editorp. ix
Contributorsp. xi
Review of ZrO/W Schottky Cathodep. 1
Liquid Metal Ion Sourcesp. 29
Gas Field Ionization Sourcesp. 87
Magnetic Lenses for Electron Microscopyp. 129
Electrostatic Lensesp. 161
Aberrationsp. 209
Space Charge and Statistical Coulomb Effectsp. 341
Resolutionp. 391
The Scanning Electron Microscopep. 437
The Scanning Transmission Electron Microscopep. 497
Focused Ion Beamsp. 523
Aberration Correction in Electron Microscopyp. 601
Computational Resources for Electron Microscopyp. 641
Indexp. 645
Table of Contents provided by Ingram. All Rights Reserved.

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